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M. Chen, L. Zheng, J. -Y. Lin, P. D. Ye and H. Li, "Analog Multilevel eDRAM-RRAM CIM for Zeroth-Order Fine-tuning of LLMs," 2025 IEEE International Memory Workshop (IMW), Monterey, CA, USA, 2025, pp. 1-4, doi: 10.1109/IMW61990.2025.11026966. keywords: {Large language models;Field effect transistors;Metals;Programming;In-memory computing;Common Information Model (computing);Silicon;Reliability;Optimization;Method of moments;Compute-in-memory (CIM);eDRAM;RRAM;MLC;oxide semiconductors;LLM fine-tuning},
Research project at ZJU, EE, Hangzhou, China
Research project at Rice, ECE, TX, USA
Research project at ZJU, EE, Hangzhou, China
Research project at ZJU, EE, Hangzhou, China
Research project at Purdue, ECE, IN, USA