Analog Multilevel eDRAM-RRAM CIM for Zeroth-Order Fine-tuning of LLMs
Published in imw 25, 2025
This paper mainly provide design methodology for fused CiM.
Recommended citation: M. Chen, L. Zheng, J. -Y. Lin, P. D. Ye and H. Li, "Analog Multilevel eDRAM-RRAM CIM for Zeroth-Order Fine-tuning of LLMs," 2025 IEEE International Memory Workshop (IMW), Monterey, CA, USA, 2025, pp. 1-4, doi: 10.1109/IMW61990.2025.11026966. keywords: {Large language models;Field effect transistors;Metals;Programming;In-memory computing;Common Information Model (computing);Silicon;Reliability;Optimization;Method of moments;Compute-in-memory (CIM);eDRAM;RRAM;MLC;oxide semiconductors;LLM fine-tuning},
